Low-Maintenance Coatings, and Methods for Producing Low-Maintenance Coatings

ABSTRACT

The invention provides a substrate bearing a low-maintenance coating. In some embodiments, the coating includes a low-maintenance film that includes both titanium oxide and tungsten oxide. The invention also provides methods and equipment for depositing such coatings.

CROSS-REFERENCE TO RELATED APPLICATIONS

The present application claims priority to U.S. Application No.60/972,527, filed Sep. 14, 2007; and U.S. Application No. 61/039,760,filed Mar. 26, 2008.

FIELD OF THE INVENTION

The present invention provides thin film coatings for substrates. Moreparticularly, the invention provides low-maintenance coatings for glassand other substrates. The invention also provides methods for producinglow-maintenance products.

BACKGROUND OF THE INVENTION

Low-maintenance coatings, for example photocatalytic coatings, are wellknown. A great deal of research has been done in attempting to developlow-maintenance coatings that exhibit good properties, such asself-cleaning properties and hydrophilicity.

Most conventional low-maintenance coatings include a layer of titaniumdioxide (i.e., TiO₂). While many of these coatings are advantageous,there is much room for improvement. For example, it would be desirableto provide thin low-maintenance coatings that have low visiblereflection and good color neutrality, and yet can achieve goodphotoactivity levels, hydrophilicity, and/or activation ability. Itwould be particularly desirable to provide coatings that achieve theseproperties while at the same time being durable, stable, and resistantto haze formation (e.g., during tempering and other heat treatments).

SUMMARY OF THE INVENTION

In certain embodiments, the invention provides a substrate having amajor surface on which there is a low-maintenance coating. Thelow-maintenance coating includes a functional film comprising bothtitanium oxide and tungsten oxide. In the present embodiments, thesubstrate is glass in an annealed state, and the functional film has athickness of less than 150 Å yet the low-maintenance coating has anacetone decomposition rate of greater than 1.4×10⁻¹⁰moles/(liter)(second).

Some embodiments of the invention provide a substrate having a majorsurface on which there is a low-maintenance coating. The low-maintenancecoating includes a functional film comprising both titanium oxide andtungsten oxide. In the present embodiments, the substrate is glass in atempered state, and the functional film has a thickness of less than 150Å yet the low-maintenance coating has an acetone decomposition rate ofgreater than 1.8×10⁻¹⁰ moles/(liter)(second).

In some embodiments, the invention provides a substrate having a majorsurface on which there is a low-maintenance coating that includes a basefilm and a functional film. The functional film comprises both titaniumoxide and tungsten oxide. In the present embodiments, the base film is ahigh-rate sputtered film deposited using at least one target in anatmosphere into which both inert gas and oxidizing gas are flowed.Preferably, the inflow rate for the inert gas divided by the inflow ratefor the oxidizing gas is between 0.4 and 2.5. The functional film inthese embodiments preferably is a high-rate sputtered film depositedfrom at least one target having a sputterable material comprising bothtitanium oxide and tungsten oxide.

Certain embodiments provide a substrate having a major surface on whichthere is a low-maintenance coating. In the present embodiments, thelow-maintenance coating has only a single photocatalytic layer, and thislayer comprises both titanium oxide and tungsten oxide throughout anentire thickness of the layer. Further, in these embodiments, thesubstrate is glass in an annealed state, and the photocatalytic layerhas a thickness of less than 150 Å yet the low-maintenance coating hasan acetone decomposition rate of greater than 1.4×10⁻¹⁰moles/(liter)(second). In some of these embodiments, the thickness ofthe photocatalytic layer is less than 100 Å and yet the acetonedecomposition rate is greater than 2.1×10⁻¹⁰ moles/(liter)(second).

Some embodiments provide a substrate having a major surface on whichthere is a low-maintenance coating. In the present embodiments, thelow-maintenance coating has only a single photocatalytic layer, and thislayer comprises both titanium oxide and tungsten oxide throughout anentire thickness of the layer. Further, in these embodiments, thesubstrate is glass in a tempered state, and the photocatalytic layer hasa thickness of less than 150 Å yet the low-maintenance coating has anacetone decomposition rate of greater than 1.8×10⁻¹⁰moles/(liter)(second). In some of these embodiments, the thickness ofthe photocatalytic layer is less than 100 Å and yet the acetonedecomposition rate is greater than 6.75×10⁻¹⁰ moles/(liter)(second).

Certain embodiments provide a method of depositing of a low-maintenancecoating on a major surface of a substrate. The low-maintenance coatinghere includes a base film and a functional film. In the present method,the base film is deposited using a high-rate sputtering techniquewherein at least one target is sputtered in an atmosphere into whichboth inert gas and reactive gas are flowed, and wherein an inflow ratefor the inert gas divided by an inflow rate for the reactive gas isbetween 0.4 and 9. In the present method, the functional film isdeposited by a high-rate sputtering technique that uses at least onetarget having a sputterable material comprising both titanium oxide andtungsten oxide. In some embodiments of this nature, the high-ratesputtering technique for depositing the base film involves a pluralityof targets each carrying a sputterable material consisting essentiallyof: 1) one or more metals, or 2) one or more semi-metals, or 3) at leastone metal and at least one semi-metal, while the high-rate sputteringtechnique for depositing the functional film involves a plurality ofoxide targets each carrying the sputterable material comprising bothtitanium oxide and tungsten oxide. For example, the sputterable targetmaterial used in depositing the functional film may include silicon, andthe sputterable target material used in depositing the functional filmmay include: i) tungsten in oxide form, ii) TiO, and iii) TiO₂. In thepresent method, the inert gas can advantageously be argon while thereactive gas is oxygen or nitrogen, and the inflow rate for the argongas divided by the inflow rate for the oxygen or nitrogen gas canoptionally be between 0.35 and 9.

Certain embodiments of the invention provide a sputtering technique fordepositing a low-maintenance coating over a major surface of asubstrate. The present sputtering technique includes sputter depositinga base film over the major surface and sputter depositing a functionalfilm over the base film. The functional film comprises both titaniumoxide and tungsten oxide. In the present embodiments, the sputterdeposition is performed such that the low-maintenance coating, asdeposited, has an average surface roughness of between about 0.35 nm and3.0 nm. Also, in the present embodiments, the substrate is glass in anannealed state, and the functional film has a thickness of less than 150Å yet the low-maintenance coating has an acetone decomposition rate ofgreater than 1.4×10⁻¹⁰ moles/(liter)(second).

Further, some embodiments provide a sputtering technique for depositinga low-maintenance coating over a major surface of a substrate. In thepresent embodiments, the sputtering technique includes depositing athickness of film comprising titania, wherein at least part of thatthickness includes tungsten oxide and is deposited by sputtering one ormore targets having a sputterable material comprising both titania andtungsten oxide, wherein the sputterable material includes: i) tungstenin oxide form, ii) TiO, and iii) TiO₂. In some cases, substantially allthe tungsten in the sputterable material is in oxide form. Thedepositing can be accomplished by sputtering the targets in anatmosphere comprising argon and oxygen. If desired, the depositing canalso be accomplished by sputtering the targets in an atmospherecomprising argon, oxygen, and nitrogen. In some cases, the sputterablematerial is characterized by a metal-only W/Ti weight ratio of betweenabout 0.01 and 0.34, such as between about 0.01 and about 0.2, thisratio being the total weight of the tungsten in the sputterable materialdivided by the total weight of the titanium in the sputterable material.The thickness of the film comprising titania preferably is less than 250Å.

A sputtering target is also provided in accordance with certainembodiments. The target can have a sputterable material comprising bothtitania and tungsten oxide, wherein the sputterable material includes:i) tungsten in oxide form, ii) TiO, and iii) TiO₂. In some cases,substantially all the tungsten in the sputterable material is in oxideform. In some embodiments, the sputterable material consists essentiallyof: i) tungsten in oxide form, ii) TiO, and iii) TiO₂. The sputterablematerial can optionally have a metal-only W/Ti weight ratio of betweenabout 0.01 and 0.34, such as between about 0.01 and about 0.2, thisratio being the total weight of the tungsten in the sputterable materialdivided by the total weight of the titanium in the sputterable material.The target can optionally be a cylindrical rotary target, with thesputterable material carried on an exterior wall of an elongated backingtube, and the elongated backing tube having a length of at least 24inches. In some of the present embodiments, the target is adapted torotate about a central axis to which the exterior wall of the backingtube is substantially parallel.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic cross-sectional view of a substrate having a majorsurface carrying a low-maintenance coating in accordance with certainembodiments;

FIG. 2 is a schematic cross-sectional view of a substrate having a majorsurface carrying a low-maintenance coating in accordance with certainembodiments;

FIG. 3 is a schematic cross-sectional view of a substrate having a majorsurface carrying a low-maintenance coating in accordance with certainembodiments;

FIG. 4 is a schematic cross-sectional view of a substrate having a majorsurface carrying a low-maintenance coating in accordance with certainembodiments;

FIG. 5 is a schematic cross-sectional view of a substrate having a majorsurface carrying a low-maintenance coating in accordance with certainembodiments;

FIG. 6 is a schematic cross-sectional view of a substrate having onesurface carrying a low-maintenance coating and another surface carryingan additional functional coating in accordance with another embodiment;

FIG. 7 is a partially broken-away schematic cross-sectional side view ofa multiple-pane insulating glazing unit that includes an exterior panehaving a first surface carrying a low-maintenance coating and a secondsurface carrying an additional functional coating in accordance withcertain embodiments;

FIG. 8 is a partially broken-away schematic cross-sectional side view ofa multiple-pane insulating glazing unit that includes an exterior panehaving a second surface carrying a functional coating and an interiorpane having a fourth surface carrying a low-maintenance coating inaccordance with certain embodiments;

FIG. 9 is a partially broken-away perspective view of a window panehaving a major surface carrying a low-maintenance coating, the panebeing mounted in an exterior wall of a building in accordance withcertain embodiments;

FIG. 10 is a schematic side view of a downward sputtering chamberadapted for use in certain methods;

FIG. 11 is a schematic side view of an upward sputtering chamber adaptedfor use in certain methods;

FIG. 12 is a schematic side view of a dual-direction sputtering chamberadapted for use in certain methods;

FIG. 13 is a schematic side view of a downward heating chamber adaptedfor use in certain methods;

FIG. 14 is a schematic side view of an upward heating chamber adaptedfor use in certain methods;

FIG. 15 is a schematic side view of an inter-stage section adapted foruse in certain methods;

FIG. 16 is a front cross-section view of an inter-stage section adaptedfor use in certain methods;

FIG. 17 is a schematic side view of a coating line, including downwardsputtering chambers and a downward heating chamber, which is adapted foruse in certain methods;

FIG. 18 is a schematic side view of a coating line, including upwardsputtering chambers and an upward heating chamber, which is adapted foruse in certain methods;

FIG. 19 is a schematic side view of a coating line, including upwardsputtering chambers and an upward heating chamber, which is adapted foruse in certain methods;

FIG. 20 is a schematic side view of a coating line, including upwardsputtering chambers and an upward heating chamber, which is adapted foruse in certain methods; and

FIG. 21 is a photograph of a testing system used for calculating acetonedecomposition rates for substrates bearing photocatalytic coatings; and

FIG. 22 is a photograph of a reactor dish that is part of a testingsystem used for calculating acetone decomposition rates for substratesbearing photocatalytic coatings.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS

The following detailed description is to be read with reference to thedrawings, in which like elements in different drawings have likereference numbers. The drawings, which are not necessarily to scale,depict selected embodiments and are not intended to limit the scope ofthe invention. Skilled artisans will recognize that the given exampleshave many alternatives that fall within the scope of the invention.

Many embodiments of the invention involve a coated substrate. A widevariety of substrate types are suitable for use in the invention. Insome embodiments, the substrate 10 is a sheet-like substrate havinggenerally opposed first 12 and second 14 major surfaces. For example,the substrate can be a sheet of transparent material (i.e., atransparent sheet). The substrate, however, is not required to be asheet, nor is it required to be transparent.

The substrate can optionally be a component of any of a variety ofbuilding materials. Examples of anticipated applications includeembodiments wherein the substrate is a sash (e.g., a window sash or adoor sash), a siding panel (e.g., an aluminum siding panel), a tentpanel, a tarpaulin (e.g., a fluorocarbon polymer tarpaulin), a plasticfilm (e.g., a fluorocarbon plastic film), a roofing shingle, a windowblind (such as a metal, plastic, or paper window blind), a paper screen(e.g., a shoji), a railing, a baluster, or an escutcheon. In oneembodiment, the substrate is a ceramic tile, such as a wall, ceiling, orfloor tile. In another embodiment, the substrate is a glass block. Avariety of suitable glass blocks can be obtained commercially fromSaint-Gobain Oberland (Koblenz, Germany). In still other embodiments,the substrate is a polyester film, a polyethylene film, a terephthalatefilm, etc. Suitable films of this nature can be obtained commerciallyfrom Nippon Soda Co., Ltd. (Tokyo, Japan). In further embodiments, thesubstrate is a fence or wall, such as a noise-reduction fence or wall.The substrate can alternatively be part of a photovoltaic device (e.g.,it can be a cover for a photovoltaic device).

For many applications, the substrate will comprise a transparent (or atleast translucent) material, such as glass or clear plastic. Forexample, the substrate is a glass sheet (e.g., a window pane) in certainembodiments. A variety of known glass types can be used, and soda-limeglass will commonly be preferred. In certain preferred embodiments, thesubstrate is part of a window, skylight, door, shower door, or otherglazing. In some cases, the substrate is part of an automobilewindshield, an automobile side window, an exterior or interior rear-viewmirror, a bumper, a hubcap, a windshield wiper, or an automobile hoodpanel, side panel, trunk panel, or roof panel. In other embodiments, thesubstrate is a piece of aquarium glass, a plastic aquarium window, or apiece of greenhouse glass. In a further embodiment, the substrate is arefrigerator panel, such as part of a refrigerator door or window. Inanother embodiment, the substrate is part of an electrochromic device.

Substrates of various sizes can be used in the present invention.Commonly, large-area substrates are used. Certain embodiments involve asubstrate 10 having a major dimension (e.g., a length or width) of atleast about 0.5 meter, preferably at least about 1 meter, perhaps morepreferably at least about 1.5 meters (e.g., between about 2 meters andabout 4 meters), and in some cases at least about 3 meters. In someembodiments, the substrate is a jumbo glass sheet having a length and/orwidth that is between about 3 meters and about 10 meters, e.g., a glasssheet having a width of about 3.5 meters and a length of about 6.5meters. Substrates having a length and/or width of greater than about 10meters are also anticipated.

In some embodiments, the substrate 10 is a generally square orrectangular glass sheet. The substrate in these embodiments can have anyof the dimensions described in the preceding paragraph and/or in thefollowing paragraph. In one particular embodiment, the substrate is agenerally rectangular glass sheet having a width of between about 3meters and about 5 meters, such as about 3.5 meters, and a length ofbetween about 6 meters and about 10 meters, such as about 6.5 meters.

Substrates of various thicknesses can be used in the present invention.In some embodiments, the substrate 10 (which can optionally be a glasssheet) has a thickness of about 1-5 mm. Certain embodiments involve asubstrate 10 with a thickness of between about 2.3 mm and about 4.8 mm,and perhaps more preferably between about 2.5 mm and about 4.8 mm. Inone particular embodiment, a sheet of glass (e.g., soda-lime glass) witha thickness of about 3 mm is used. In one group of embodiments, thethickness of the substrate is between about 4 mm and about 20 mm.Thicknesses in this range, for example, may be useful for aquarium tanks(in which case, the substrate can optionally be glass or acrylic). Whenthe substrate is float glass, it will commonly have a thickness ofbetween about 4 mm and about 19 mm. In another group of embodiments, thesubstrate is a thin sheet having a thickness of between about 0.35 mmand about 1.9 mm. Embodiments of this nature can optionally involve thesubstrate 10 being a sheet of display glass or the like.

FIGS. 1-7 show a substrate 10 with a major surface 12 bearing alow-maintenance coating 80. The low-maintenance coating 80 can havephotocatalytic properties, hydrophilic properties, or both. In preferredembodiments, the coating 80 has photoactivity as determined by theacetone decomposition test that will now be described.

The following system is used to determine the acetone decompositionslope. Reference is made to FIGS. 21 and 22. Fourier transform infrared(FT-IR) spectroscopy is used (Thermo Nicolet 8700 FT-IR with MCT-Aliquid nitrogen cooled detector and a KBr beam splitter). In particular,the following system features are used: Nicolet 8700 Gold system optics;sealed, desiccated optical bench; Ge-on KBr beam splitter (7800-350cm⁻¹); MCT-A liquid nitrogen cooled detector (11700-600 cm⁻¹); ResearchOMNIC Professional 7.1; Val-Q System validation package; OMNIC FT-IRSoftware Operations. The system is a recycling closed loop system,including a pump (a piston pump) and a reactor cell (a reactor dish).Stainless steel tubing connects the components. The piston pump iscommercially available from Fluid Metering, Inc. (Syosset, N.Y., USA):Item ID=Pump Drive Module, Q 115 VAC 60 Hz; Item ID=Q1CSY, Q Pump HeadModule, and; Item ID=R412-2, Adapter, ⅜″ Tube, SS (the pump setting usedis 8 out of a possible 10). The reactor dish can be obtained from AllenScientific Glass, Inc. (Boulder, Colo., USA), e.g., under product code530. The dish has a solid bottom with a diameter of 8 inches. Thesidewall of the dish has a height of 1.8 inches. The dish is gas tightand has an internal volume of 1.5 liters. The dish has three ports, eachwith a diameter of ⅜ inch. The bottom portion of the dish is Pyrex, andit has a lid formed of quartz. Two ports on the dish are connected tostainless steel tubing so that gas circulates, and another port on thedish is provided to allow acetone injection into the dish through arubber disc. The quartz lid is placed on an O-ring that is seated intothe lip of the dish's Pyrex bottom portion. A delrin hold down ring isplaced over the quartz lid, and the ring and quartz lid are clamped downby a schott flange with quick clamp. Following acetone injection, therubber disc seals the port so the system is closed. One 4″×6″low-maintenance coated sample is placed in the reactor dish with thelow-maintenance coating facing up. The volumes for the FTIR sample cell,reactor dish, and stainless steel tubing are: 500 milliliters (FTIRsample cell); 1.5 liters (reactor dish); and 97 milliliters (stainlesssteel tubing). The UV source is a 1,000 Watt Oriel Solar Simulator witha 4 inch by 4 inch beam, which is commercially available from NewportCorporation (Mountain View, Calif., U.S.A.). The gas sample cell iscommercially available from Infrared Analysis Inc. (Anaheim, Calif.,USA) under the model number 7.2-V. The gas sample cell is the 6-PAcustomized to be a variable-path long path cell adjustable in steps of0.6 meters from 0.6 meters to 7.2 meters. The gas sample cell has thefollowing features: black-anodized aluminum endplates; interior mirrorcarriage hardware; glass mirror blanks with protected-Gold opticalcoating; KCI windows, Viton o-ring seals; laser for path lengthverification and mirror alignment.

The test is performed by closing the system and pumping for an hour tostabilize. Closed means there is no longer any dry air purging throughthe system, all valves are closed, and the pump is circulating airthrough the tubing, reactor dish, and sample cell. A background scan andthree FT-IR scans are taken prior to injecting acetone into the closedsystem. One half micro liter of acetone is injected. Once the acetone isinjected, FT-IR scans are taken every 5 minutes. The UV is turned on 2-3hours after injecting the acetone. This allows the system to equilibrateprior to turning on the 1000 W Oriel Solar Simulator. The UV is on for4-5 hours, during which time FT-IR scans are taken every 5 minutes.

The data resulting from each scan are plotted as a curve of absorbanceversus wavenumbers (cm⁻¹). The FT-IR peaks show the presence of acetone.The acetone peak from 1260-1160 cm⁻¹ is used to calculate the acetonedecomposition slope. In particular, the corrected peak area under thecurve at 1260-1160 cm⁻¹ is calculated using a macro set up within theFT-IR software and is plotted in Excel versus time in minutes tocalculate the slope (thus, the reported slope is the change in thiscorrected peak area over time in minutes). The data points used arethose from the linear portion of the data from the time UV is turned onuntil all the acetone is decomposed. The linear portion of the data isplotted versus time in minutes, and from this the slope is calculated,such plotting and slope calculation being performed with the Trendlineoption in Microsoft Excel 2000.

The following discussion of a few acetone peaks is useful to furtherillustrate the foregoing method. A first curve results from a scan doneprior to the acetone being injected into the system, and therefore hasno peak at 1260-1160 cm⁻¹. Another curve results from a scan taken oncethe acetone has equilibrated and just before UV is turned on. Subsequentcurves show the decline in the acetone peak, illustratingphotodecomposition of the acetone and hence a reduction in the amount ofacetone measured by the FT-IR. Thus, the slope is calculated by plottingthe change in the area under the noted curve after the UV light isturned on and prior to all the acetone being decomposed.

Once an acetone decomposition slope has been determined, the slope canbe converted to a rate using the following equation: acetonedecomposition rate=(2.55×10⁻⁹)×(acetone decomposition slope). It is tobe understood that this conversion factor is specific to the presentsystem; it is not a universal conversion factor. The rate is in units ofmoles/(liter)(second). As examples, consider the following:

Rate moles/ Product Slope (liter)(second) Annealed glass/200 Å high rate.0772 1.97 × 10⁻¹⁰ SiO₂/55 Å high rate TiO₂:W Tempered* glass/200 Å highrate .2141 5.46 × 10⁻¹⁰ SiO₂/55 Å high rate TiO₂:W Annealed glass/200 Åhigh rate .0839 2.14 × 10⁻¹⁰ SiO₂/70 Å high rate TiO₂:W Tempered*glass/200 Å high rate .2674 6.82 × 10⁻¹⁰ SiO₂/70 Å high rate TiO₂:W*After being coated, the glass was heat-treated in a furnace to simulatetempering in a commercial production setting.

In certain embodiments, the low-maintenance coating has an acetonedecomposition rate of greater than 1.4×10⁻¹⁰, preferably greater than1.785×10⁻¹⁰, more preferably greater than 1.91×10⁻¹⁰, or even greaterthan 2×10⁻¹⁰, and perhaps optimally greater than 2.1×10⁻¹⁰. In someembodiments of this nature, the functional film has a thickness of lessthan 150 Å, or even less than 100 Å (such as about 50-80 Å), and yet thelow-maintenance coating has an acetone decomposition rate above one ormore of the noted levels. Some embodiments provide annealed glassbearing a low-maintenance coating with an acetone decomposition rateabove one or more of these levels.

In some embodiments where the substrate is annealed glass, thelow-maintenance coating has an average surface roughness Ra of between0.35 nm and 3.0 nm, such as between 0.35 nm and 2.0 nm, and in somecases between 0.4 nm and 1.0 nm. The surface roughness, though, can bevaried; it is by no means required to be within any of these ranges.Some embodiments, for example, may provide much higher surfaceroughness.

Glass in an annealed state can readily be scored and cut. Heat treatmentabove 350 degrees Fahrenheit will normally remove the anneal ofsoda-lime glass. As is well known, annealing is a process of slowlycooling glass to relieve internal stresses. The process is carried outin a temperature-controlled kiln, which is called a lehr. Glass that hasnot been annealed, or has lost its anneal, tends to crack or shatterwhen subjected to temperature change or mechanical shock. Annealingglass, and retaining the anneal, is desirable for the durability of theglass. If glass is not annealed, or loses its anneal, it will havesubstantial thermal stresses and its strength will be decreasedconsiderably.

In the annealing process, glass is heated until its temperature reachesa stress-relief point (i.e., the annealing temperature, which is alsoreferred to as the annealing point). At this point, the glass issufficiently soft that the stresses in the glass relax, yet it is stilltoo hard to deform. The glass is then heat-soaked until its temperatureis even throughout. Then, the glass is cooled slowly at a predeterminedrate until the temperature of the glass is below its strain point.Finally, the glass temperature can be dropped to room temperature. Glassin an annealed state can be cut, drilled, polished, etc.

Thus, some embodiments provide a low-maintenance coating that is onglass in an annealed state and can achieve acetone decomposition ratesabove one or more of the noted levels. Some prior art photocatalyticcoatings only report photoactivity (or significant levels ofphotoactivity) after being calcined or otherwise heat treated attemperatures that would remove the anneal of glass. While such hightemperature treatments may be advantageous for increasing thephotoactivity of the coating, they may not be feasible when it isnecessary to provide the coating on annealed glass (which can be readilyscored and cut). Thus, the present embodiments provide a low-maintenancecoating that can provide surprising levels of photoactivity withoutrequiring the coating to be calcined or otherwise treated attemperatures that would remove the anneal of glass.

Similarly, some embodiments provide a low-maintenance coating made bymaintaining the substrate during deposition at a temperature notexceeding 350 degrees Fahrenheit, not exceeding 300 degrees Fahrenheit,or not exceeding 250 degrees Fahrenheit.

In certain embodiments, the invention provides a substrate (optionallyglass in an annealed state) bearing a low-maintenance coating that, iftempered, experiences an increase of its acetone decomposition rate.Preferably, the increase results in the acetone decomposition rate beinggreater than 1.8×10⁻¹⁰ moles/(liter)(second), more preferably greaterthan 2.5×10⁻¹⁰ moles/(liter)(second), and even more preferably greaterthan 4×10⁻¹⁰ ¹⁰ moles/(liter)(second). Perhaps optimally, the increaseresults in the rate being greater than 5.1×10⁻¹⁰ moles/(liter)(second),greater than 6.3×10⁻¹⁰ moles/(liter)(second), or even greater than6.75×10⁻¹⁰ moles/(liter)(second).

Additionally or alternatively, the low-maintenance coating may in somecases have the advantageous property that, if tempered, it experiencesan increase of its acetone decomposition rate by more than a factor of1.5, or by more than a factor of two, or even by more than a factor ofthree. The acetone decomposition rate of the first product tabulatedabove, for example, increased from 1.97×10⁻¹⁰ moles/(liter)(second) to5.46×10⁻¹⁰ moles/(liter)(second) due to tempering, resulting in apost-temper decomposition rate that is more than 2.75 times itspre-temper rate. And the acetone decomposition rate of the secondproduct tabulated above increased from 2.14×10⁻¹⁰ moles/(liter)(second)to 6.82×10⁻¹⁰ moles/(liter)(second) due to tempering, resulting in apost-temper decomposition rate that is more than three times itspre-temper rate. However, it is by no means required that thephotoactivity of the present coatings increase if tempered; in somecases, there may be no substantial change in photoactivity due totempering.

Tempered glass is much stronger than standard glass. Tempered glassbreaks in a special way. It does not break into large dangerous shards.And if any part of the glass breaks, then the entire pane shatters.Tempered glass is manufactured by a process that involves intenseheating and rapid cooling, making it harder than standard glass.Tempered glass may be characterized, for example, as having a surfacecompression of greater than about 10,000 psi.

In tempering, glass is commonly placed in a furnace maintained at about680-705° C. (preferably controlled to 690-700° C.). The glass istypically held in the furnace for 100-120 seconds with constant movementto better ensure temperature uniformity of the product. This is intendedto raise the glass temperature to about 640° C. The glass is thenremoved from the furnace and cooled rapidly in a stream of air for about50 seconds such that the glass is cool enough for an operator to handle.

Thus, the invention also provides embodiments wherein the substratebearing the low-maintenance coating is tempered glass. Here, thesubstrate is glass in a tempered state, and the low-maintenance coatingpreferably has an acetone decomposition rate of greater than 1.8×10⁻¹⁰moles/(liter)(second), more preferably greater than 2.5×10⁻¹⁰moles/(liter)(second), and even more preferably greater than 4×10⁻¹⁰moles/(liter)(second). Perhaps optimally, the rate is greater than5.1×10⁻¹⁰ moles/(liter)(second), greater than 6.3×10⁻¹⁰, or even greaterthan 6.75×10⁻¹⁰. In some embodiments of this nature, the functional filmhas a thickness of less than 150 Å, or even less than 100 Å (such asabout 50-80 Å), yet the low-maintenance coating has an acetonedecomposition rate above one or more of the noted levels.

In some embodiments where the substrate is tempered glass, thelow-maintenance coating has an average surface roughness Ra of between0.35 nm and 5.0 nm, such as between 1.0 nm and 4.5 nm, e.g., between 2.0nm and 4.0 nm. Again, the surface roughness is not required to be withinany of these ranges. For example, some embodiments may involve greaterroughness.

The coating 80 includes a functional film 50 comprising both titaniumoxide and tungsten oxide. In certain embodiments, some, substantiallyall, or all of the tungsten in the functional film 50 is in oxide form.In some cases, the functional film 50 consists essentially of titaniumoxide and tungsten oxide. Preferably, the functional film contains moretitanium oxide than tungsten oxide. In some embodiments, the functionalfilm 50 has between about 1-20 weight percent tungsten, such as about 1-10 weight percent tungsten, and perhaps optimally about 1-6 weightpercent tungsten (such percentages being determined on the basis of theweight of the tungsten in the film relative to the total weight of allcomponents of the film, e.g., which in some cases will consist of thecombined weight of titanium, oxygen, and tungsten in the film).

The functional film 50 can generally be a homogenous film, asubstantially homogenous film, a graded film, or some other type ofnon-homogenous film. In one group of embodiments, the functional film 50is a homogenous or substantially homogenous film comprising bothtitanium oxide (e.g., TiO₂) and tungsten oxide. The film 50, forexample, can be a substantially homogenous film of a mixed oxidecomprising both titanium oxide and tungsten oxide (as opposed to a filmof TiO₂ with islands of WO on the surface of the TiO₂). In someembodiments, the film is substantially uniform in that it does notcomprise pre-formed particles (e.g., of TiO₂) dispersed in a binder(e.g., of WO).

In some preferred embodiments, the functional film 50 defines anexposed, outermost face of the low-maintenance coating 80. In alternateembodiments, at least one film (such as a thin hydrophilic film, oranother photocatalytic film) may be positioned over the functional film.Embodiments of this nature are exemplified in FIG. 3, which depicts anoutermost film (OF) over the functional film 50.

Adding tungsten oxide to a film comprising titanium oxide can increasephotoactivity and hydrophilicity. However, a thick film of titaniumoxide and tungsten oxide may be limited in terms of haze resistance,durability, and/or stability. Surprisingly, the inventors havediscovered that incorporating tungsten oxide into a titanium oxide filmof small thickness and/or providing the tungsten load at specialpercentages can provide good photoactivity and hydrophilicity while atthe same time achieving good haze resistance, durability, and stability.The inventors have also found that these properties can be improved byadjusting the surface roughness of the coating (such as by depositing abase layer using a special high rate process), by adjusting thethickness of the base layer, or both.

The functional film 50 can include TiO₂, TiO, or both. Other forms oftitanium oxide may also be present. In certain embodiments, the film 50includes titanium oxide, tungsten oxide, and at least one additionalmaterial, such as a material selected from the group consisting ofnitrogen, tantalum, copper, silica, palladium, tin, niobium, andmolybdenum. Other “additional materials” can also be used. Theadditional material can be a dopant, which may be present in an amountup to about ten weight percent, such as about five weight percent orless, e.g., about 2-3 weight percent or less. Larger concentrations maybe preferred in other cases. The additional material, when provided, canbe present throughout the functional film 50 or only in a certainportion of the film 50.

In one group of embodiments, the functional film 50 includes nitrogen,e.g., it can comprise an oxynitride. When provided, the nitrogen may bepresent in an amount of 10 weight percent or less, more preferably 5weight percent or less.

The thickness of the functional film 50 generally is less than 500 Å,preferably less than 300 Å, more preferably less than 250 Å, such asless than 200 Å, less than 150 Å, or even less than 100 Å. In someembodiments, the thickness is 30-90 Å, preferably 40-85 Å, and perhapsoptimally 50-80 Å. The inventors have found these thickness ranges to beparticularly advantageous in minimizing, or even eliminating, the colorthat can occur with thicker films. In other embodiments, though, thickerfilms may be used for applications where more color is desirable, or atleast acceptable, or where another coating or pane neutralizes the coloradequately.

The inventors have discovered that when the thickness of the functionalfilm is less than about 100 Å (more preferably less than 90 Å), thecoating 80 can achieve an exceptional degree of haze resistance. Forexample, the haze of a glass pane carrying the present low-maintenancecoating 80 can be less than 0.40 after tempering, or even less than0.30, such as between about 0.2 and about 0.27. Haze can be measuredusing a BYK Gardner Haze-Gard Plus device. The specimen surface isilluminated perpendicularly, and the transmitted light is measuredphotoelectrically, using an integrating sphere (0°/diffuse geometry).

The inventors have also discovered that if the thickness of the filmcomprising titanium oxide and tungsten oxide is greater than about 40 Å(more preferably greater than about 50 Å), then there is a surprisingboost in photoactivity, hydrophilicity, or both when the coatedsubstrate is tempered. When the thickness is substantially smaller,tempering does not appear to provide such a boost. Thicknesses of about40 Å or greater, perhaps optimally 50 Å or greater (e.g., about 50 Å-80Å, such as about 70 Å) are therefore preferred in this regard. Themechanism behind this surprising boost in properties has not beenexplained definitively. It is surmised, however, that when the coatedsubstrate is heat treated, this causes a decrease in density of defectstates of the film allowing the photoexcited electrons in the conductionband of the titania to have a longer lifetime resulting in an increasein quantum efficiency. The improved quantum efficiency results in moreelectron-hole pairs to generate hydroxyl radicals (OH.) and superoxideions (O₂ ⁻) to decompose and mineralize organic compounds byparticipating in a series of oxidation reactions. This results in afavorable change in photoactivity, hydrophilicity, or both.Surprisingly, the boost seems not to occur unless the noted minimumthickness threshold is exceeded. The inventors, though, do not wish tobe bound by this explanation.

In certain embodiments, the functional film 50 has a tungsten loadcharacterized by a metal-only atomic ratio of between about 0.001 and0.4, such as between about 0.01 and about 0.34. This ratio is the numberof tungsten atoms in the film 50 divided by the number of titanium atomsin the film.

With reference to FIG. 2, in some embodiments, the low-maintenancecoating 80 includes a base film 15 between the functional film 50 andthe substrate 10. In general, the base film 15 can be any suitablematerial that adheres well to the substrate, protects the functionalfilm 50 from sodium ion diffusion, or both. In cases where the base film15 is omitted, the substrate 10 itself can optionally be treated toreduce or perhaps deplete the surface area of the substrate of sodiumions. The base film 15 comprises a dielectric film in some embodiments.In certain embodiments, the base film comprises silica, alumina, orboth. The base film 15 can optionally be a mixed oxide film includingtwo or more materials. In some cases, it is a mixed oxide filmcomprising silica and alumina, or silica and titania, or silica, aluminaand titania. Other materials can be used as well.

The base film 15 can generally be a homogenous film, a substantiallyhomogenous film, a graded film, or some other non-homogenous film. Whenprovided, the base film 15 may be deposited directly onto the substrate,with the functional film 50 being deposited directly onto the base film15. This, however, is by no means required. When provided, the base film15 can optionally have a thickness of less than about 300 Å. In certainembodiments, the base film 15 has a thickness of less than 275 Å or evenless than 250 Å. The base film 15, for example, can have a thickness ofbetween 175 Å and 225 Å, such as about 200 Å-225 Å. The noted thicknessranges, however, are merely exemplary; it may be desirable to providemuch greater thicknesses, e.g., to provide more of a barrier to sodiumion diffusion.

In certain embodiments, the base film 15 comprises or consistsessentially of silica and alumina. The entire thickness of the basefilm, for example, can optionally comprise a mixed oxide of silica andalumina. Such a mixed oxide film can be formed by sputtering an alloytarget that includes silicon and aluminum, for example about 50% siliconand about 50% aluminum, or about 25% silicon and about 75% aluminum,about 75% silicon and about 25% aluminum, or about 85% silicon and about15% aluminum. Such alloy targets can be sputtered in an oxidizingatmosphere. A mixed film of this nature can also be formed byco-sputtering two targets, wherein one target is a silicon target andthe other target is an aluminum target. Co-sputtering can be performedin an oxidizing atmosphere. In other embodiments, the base film 15comprises or consists essentially of alumina. Alumina is believed to bea good barrier to sodium ion diffusion. And it may help improveperformance of the coated substrate in certain testing (e.g., 100%relative humidity testing).

In still other embodiments, the base film 15 comprises or consistsessentially of silicon nitride. One embodiment provides a substrate onwhich there is a low-maintenance coating comprising the following filmsin sequence: substrate/film comprising silicon nitride/film comprisingboth titanium oxide and tungsten oxide. In this embodiment, there canoptionally be one or more additional films under, between, and/or overthe noted films. Alternatively, the film comprising silicon nitride canbe contiguous to the substrate, and the film comprising titaniumoxide/tungsten oxide can be contiguous to the film comprising siliconnitride. If desired, these two films can have a combined thickness ofless than 350 Å. In the present embodiment, the films comprising,respectively, silicon nitride and titanium oxide/tungsten oxide can haveany of the properties and characteristics described herein for thefunctional film 50 and the base film 15, respectively.

In some preferred embodiments, the low-maintenance coating is providedwith an average surface roughness Ra of between 0.35 nm and 5.0 nm, suchas between 0.35 nm and 4.0 nm, and in some cases between 0.4 nm and 3.0nm. Conventional DC reactive sputtering may provide a surface roughnessof about 0.3 nm for a coating consisting of a first layer comprisingsilica at about 75 Å and an overlying TiO₂ layer at about 25-45 Å. Inthe present embodiments, special techniques can be used to provide thecoating with an average surface roughness in the specified ranges. Thebase film, for example, can be sputter deposited using a special highrate process (e.g., using a large amount of argon). When a high rateprocess is used, the base film tends to develop a surface roughnesswithin the noted ranges (other appropriate deposition methods, otherstarting materials, and/or post-deposition treatments could also be usedto provide the noted surface roughness levels, and such other means arewithin the scope of the present embodiments). When the functional film50 is then deposited over this controlled-roughness base film, theresulting low-maintenance coating can have an advantageous level ofsurface roughness. Additionally or alternatively, the functional film 50can be sputter deposited using a high rate process (e.g., using an oxidetarget, a large amount argon, or both). It is surmised that theresulting level of surface roughness contributes to the coating'sability to achieve good photoactivity while being provided at such asmall thickness.

In the present controlled-surface-roughness embodiments, the coatingstill is relatively smooth compared to films produced by many otherconventional methods that yield high surface roughness. In this regard,the present films are designed to have a level of surface roughness thatinhibits dirt particles from becoming trapped in the roughness of thecoating. When dirt particles get trapped in the roughness of a coating,it can be difficult to rinse away the trapped particles. Thephotoactivity of the coating does not break down inorganics/minerals, sothey may stay trapped in the coating. In contrast, the presentlow-maintenance coating can be designed to be smooth enough that manydirt particles are simply too big to get trapped in the roughness of thecoating, thereby allowing those particles to be readily rinsed away.

One group of embodiments provides the low-maintenance coating 50 with abase film 15 that is a high-rate sputtered film, which (as an example)can be deposited from at least one target in an atmosphere into whichboth inert gas and reactive gas are flowed. Preferably, the ratio of theinflow rate for the inert gas (e.g., Ar) divided by the inflow rate forthe reactive gas (e.g., O₂) is between 0.4 and 9, such as between 0.4and 6, commonly between 0.4 and 2.5, and in some cases between 0.5 and2. In some embodiments, the reactive gas consists essentially of oxygen,nitrogen, or both. Some embodiments provide the base film as a filmcomprising SiO₂ or Si₃N₄. In certain embodiments, the high-ratesputtering technique for depositing the base film involves a pluralityof targets each carrying a sputterable material consisting essentiallyof: 1) one or more metals, or 2) one or more semi-metals, or 3) at leastone metal and at least one semi-metal. As one example, the high-ratebase film can comprise silica sputtered from targets consisting of about85% silicon and about 15% aluminum in an atmosphere into which argon isflowed at about 40-85% with the remainder being oxygen.

Additionally or alternatively, the functional film 50 can be a high-ratesputtered film, which (as an example) can be deposited from at least onetarget having a sputterable material comprising both titanium oxide andtungsten oxide. In connection with the atmosphere used to sputterdeposit the functional film 50, the ratio of the inflow rate for theinert gas (e.g., Ar) divided by the inflow rate for the reactive gas(e.g., O₂) preferably is between 0.4 and 9, such as between 0.4 and 6.The functional film 50 can, for example, be sputtered from oxide targetsin an atmosphere into which argon is flowed at about 85% with theremainder being oxygen. In some embodiments, the oxide targets have asputterable material comprising: i) tungsten in oxide form, ii) TiO, andiii) TiO2. In some cases, the oxide target comprises a sputterablematerial consisting essentially of titanium oxide and tungsten oxide,where the titanium is present at about 59-74 weight %, the tungsten ispresent at about 1.4-3.8 weight %, and the oxygen is present at about23.3-38.6 weight %. The specific composition, of course, will varydepending upon the requirements for a particular product.

In the present embodiments (where the coating includes a high-rate baselayer, a high-rate functional film, or both), the coating can have asurface roughness within one or more of the ranges noted herein. Ofcourse, different applications may call for different levels of surfaceroughness, so these ranges are not required. Similarly, the coating inthe present embodiments can have the small thickness and high acetonedecomposition levels specified herein. However, this is not strictlyrequired either, since different products may call for differentthicknesses, different photoactivity levels, etc.

When the coating consists essentially of sputtered film, it can have ahigh degree of thickness uniformity. In such embodiments, the physicalthickness of the coating preferably varies by less than 40 Å, and morepreferably by less than 20 Å, across the area of the coating. That is,the maximum local thickness of the coating preferably is not more than40 Å greater (e.g., not more than 20 Å greater) than the minimum localthickness of the coating, taking into account the thickness of thecoating at all regions. The thickness uniformity of such a sputteredcoating can provide particularly uniform properties (color, visiblereflection, lack of haze, etc.).

Some embodiments provide the low-maintenance coating with a base film 15and a functional film 50 having a combined thickness of less than about350 Å, or even less than 300 Å.

Certain embodiments provide the low-maintenance coating with only asingle photocatalytic layer (e.g., only one layer including titaniumoxide). And yet the coating 80 in these embodiments preferably achievesthe acetone deposition rates described herein (e.g., even when thethickness of the sole photocatalytic layer is less than 150 Å, or lessthan 100 Å). Preferably, the layer 50 in these embodiments contains bothtitanium oxide and tungsten oxide throughout the entire thickness of thelayer 50. More generally, the single photocatalytic layer of the presentembodiments can have the properties and characteristics (thickness,tungsten load, surface roughness, product-by-process distinction, etc.)of any embodiment described herein. Further, in the present embodiments,the coating preferably includes the optional base layer 15. As with thephotocatalytic layer, the base layer (when provided in the presentembodiments) can have the properties and characteristics (thickness,surface roughness, product-by-process distinction, etc.) of anyembodiment described herein. In the present embodiments, the coating canbe very thin (hence having little or no color) and yet can achievesurprisingly high photoactivity rates. The inventors have discoveredthat this good photoactivity can be achieved even when the coating is sothin that it presents essentially no visible defects if the coating isscratched or otherwise damaged. Thus, even if the coating is damaged,the damage can be invisible or at least inconspicuous.

In some embodiments, the coating consists essentially of two layers: abase film 15 and a functional film 50. In other embodiments, between thesubstrate and a base film 15 there is provided at least one other film,e.g., an optional innermost layer can comprise silica or siliconnitride, and the base film 15 can comprise alumina, titania, tungstenoxide, or zirconia. Many other variants are possible and will beapparent to skilled artisans given the present teaching as a guide.

Additionally or alternatively, the low-maintenance coating 80 canoptionally include at least one additional film 20 between thefunctional film 50 and a base film 15. FIGS. 4 and 5 show a singleintermediate film 20 of this nature. However, multiple intermediatefilms can be provided, if so desired. When provided, such film(s) 20 cancomprise various materials, such as silica, alumina, titania, zirconiaor tungsten oxide to name just a few.

Table 1 below shows an embodiment where the low-maintenance coating 80has a total thickness of about 270 Å. It is to be appreciated, however,that the coating 80 can have much larger thicknesses, depending on therequirements of the intended application. Smaller thicknesses are alsoanticipated.

Following are several exemplary embodiments.

TABLE 1 (Coating #1) Material (comprising, consisting Componentessentially of, or consisting of) Thickness Functional Titania andtungsten oxide 50-80 Å, Film 50 e.g., 70 Å Base Film 15Silicon-containing film, optionally 50 Å-400 Å, comprising SiO₂ or Si₃N₄e.g., 200 Å Substrate Glass —

TABLE 2 (Coating #2) Material (comprising, consisting Componentessentially of, or consisting of) Thickness Functional Titania andtungsten oxide 50-80 Å, Film 50 e.g., 70 Å Base Film 15 Alumina 50 Å-400Å, e.g., 200 Å Substrate Glass —

TABLE 3 (Coating #3) Material (comprising, consisting Componentessentially of, or consisting of) Thickness Functional Titania andtungsten oxide 50-80 Å, Film 50 e.g., 70 Å IntermediateSilicon-containing film, optionally 10 Å-300 Å, Film 20 comprising SiO₂or Si₃N₄ e.g., 40 Å Base Film 15 Alumina 10 Å-300 Å, e.g., 30 ÅSubstrate Glass —

TABLE 4 (Coating #4) Material (comprising, consisting Componentessentially of, or consisting of) Thickness Functional Titania andtungsten oxide 50-80 Å, Film 50 e.g., 70 Å Intermediate Alumina 10 Å-300Å, Film 20 e.g., 40 Å Base Film 15 Silicon-containing film, optionally10 Å-300 Å, comprising SiO₂ or Si₃N₄ e.g., 30 Å Substrate Glass —

In FIG. 5, the low-maintenance coating 80 includes a film 13 between thesubstrate 10 and a base film 15. When provided, film 13 can comprise,for example, a transparent conductive oxide (TCO) film. Film 13 canoptionally be in direct contact with both the substrate 10 and the basefilm 15. This, however, is not required. For example, one or more otherfilms (such as a single film comprising silica, or a film sequencecomprising SiO/SnO/SiO) can be provided between the substrate 10 andfilm 13. Additionally or alternatively, films 15 and/or 20 can beomitted, if so desired. In certain embodiments, film 13 is asemi-conductor film. Suitable TCO films include zinc aluminum oxide,fluorine-doped tin oxide, and indium tin oxide. In some embodiments,film 13 is provided at a thickness of 10,000 Å or less, such as betweenabout 1,000 Å to about 7,000 Å, e.g., about 3,000 Å. By providing atransparent conductive film 13 under the low-maintenance coating 80, itis possible to reduce the overall U value of a glazing incorporating thecoated substrate.

Following are a few exemplary embodiments.

TABLE 5 (Coating #5) Material (comprising, consisting Componentessentially of, or consisting of) Thickness Functional Titania andtungsten oxide 50-80 Å, Film 50 e.g., 70 Å IntermediateSilicon-containing film, optionally 10 Å-300 Å, Film 20 comprising SiO₂or Si₃N₄ e.g., 40 Å Base Film 15 Alumina 10 Å-300 Å, e.g., 30 Å Semi-Transparent Conductive Oxide 1,000 Å-7,000 Å, Conductor (zinc aluminumoxide, ITO, e.g., 3,000 Å Film 13 fluorine-doped tin oxide, or any otherTCO) Substrate Glass —

TABLE 5A (Coating #5A) Material (comprising, consisting Componentessentially of, or consisting of) Thickness Functional Titania andtungsten oxide 50-80 Å, Film 50 e.g., 70 Å IntermediateSilicon-containing film, optionally 10 Å-300 Å, Film 20 comprising SiO₂or Si₃N₄ e.g., 70 Å Semi- Transparent Conductive Oxide 1,000 Å-7,000 Å,Conductor (zinc aluminum oxide, ITO, e.g., 3,000 Å Film 13fluorine-doped tin oxide, or any other TCO) Barrier LayerSilicon-containing film, optionally 10 Å-800 Å, comprising SiO₂ or Si₃N₄e.g., 500 Å Substrate Glass —

TABLE 5B (Coating #5B) Material (comprising, consisting Componentessentially of, or consisting of) Thickness Functional Titania andtungsten oxide 50-80 Å, Film 50 e.g., 70 Å Intermediate Alumina 10 Å-300Å, Film 20 e.g., 70 Å Semi- Transparent Conductive Oxide 1,000 Å-7,000Å, Conductor (zinc aluminum oxide, ITO, e.g., 3,000 Å Film 13fluorine-doped tin oxide, or any other TCO) Barrier LayerSilicon-containing film, optionally 10 Å-800 Å, comprising SiO₂ or Si₃N₄e.g., 500 Å Substrate Glass —

One group of embodiments provides a substrate with a major surface onwhich the following films are coated in sequence, moving outwardly fromthe major surface: (1) a first functional film comprising a materialselected from the group consisting of zinc aluminum oxide, indium tinoxide, and fluorine-containing tin oxide; and (2) a second functionalfilm comprising both titanium oxide and tungsten oxide. In some of theseembodiments, a thickness ratio defined as the thickness of the secondfunctional film divided by the thickness of the first functional film isbetween about 0.004 and about 0.08, and perhaps more preferably betweenabout 0.004 and about 0.025. In one example, the second functional filmhas a thickness of about 70 Å and the first functional film (e.g.,transparent conductive oxide layer) has a thickness of about 3,000 Å,such that the noted thickness ratio is about 0.023. In another example,the second functional film has a thickness of about 70 Å and the firstfunctional film has a thickness of about 2,000 Å, such that the notedthickness ratio is about 0.035. In still another example, the secondfunctional film 50 has a thickness of about 70 Å and the firstfunctional film has a thickness of about 5,000 Å, such that the notedthickness ratio is about 0.014. In yet another example, the secondfunctional film 50 has a thickness of about 50 Å and the firstfunctional film has a thickness of about 3,000 Å, such that the notedthickness ratio is about 0.016. In some of the present embodiments, thenoted thickness ratio is within one or more of the specified ranges incombination with the second functional film being less than 200angstroms thick, e.g., less than 100 angstroms thick, and/or the firstfunctional film is less than 5,500 angstroms thick, or even less than3,500 angstroms thick.

In some cases, the low-maintenance coating 80 is provided on one majorsurface of the substrate and another functional coating 70 is providedon an opposite major surface of the same substrate. FIG. 6 illustratesone such embodiment. Here, the substrate 10 has a first surface 12bearing the low-maintenance coating 80 and a second surface 14 bearinganother functional coating 70. Functional coating 70 can be a singlelayer or a stack of layers. Various functional coatings can be used. Insome cases, the functional coating 70 is a low-emissivity coating. Insome embodiments, the coating 70 has three or more infrared-reflectivelayers (e.g., silver-containing layers). Low-emissivity coatings withthree or more infrared-reflective layers are described in U.S. patentapplication Ser. Nos. 11/546,152, 11/545,323, 11/545,231, 11/545,212,11/545,211, 11/398,345, and 11/360,266, the salient teachings of each ofwhich are incorporated herein by reference. In other cases, functionalcoating 70 can be a “single silver” or “double silver” low-emissivitycoating, which are well-known to skilled artisans. When provided,functional coating 70 can alternatively comprise a transparentconductive oxide (TCO) layer, as will now be discussed.

One particular product includes the following sequence: film comprisingboth titanium oxide and tungsten oxide/substrate/film comprisingsilicon/film comprising zinc aluminum oxide. As just one example, thefilm comprising silicon can include silicon oxide (e.g., SiO₂). The zincaluminum oxide can optionally have a thickness of less than 8,000 Å,less than 7,000 Å, or even less than 6,500 Å, such as about 6,000 Å. Thefilm comprising both titanium oxide and tungsten oxide can optionallyhave a thickness of less than 200 Å, such as less than 100 Å. Thesubstrate can be glass, such as soda-lime glass. The noted sequence caninclude other films in addition to those shown. As just one example, thearticle can include the following sequence: film comprising bothtitanium oxide and tungsten oxide/film comprising siliconoxide/substrate/film comprising silicon oxide/film comprising zincaluminum oxide. Additional films, layers, substrates, contacts, etc. canalso be provided.

With reference to FIGS. 7 and 8, the substrate 10 can optionally be atransparent pane that is part of an insulating glazing unit 110.Typically, an insulating glazing unit 110 has an exterior pane 10 and aninterior pane 10′ separated by a between-pane space 800. A spacer 900(which can optionally be part of a sash) is commonly provided toseparate the panes 10 and 10′. The spacer 900 can be secured to theinterior surfaces of each pane using an adhesive or seal 700. In somecases, an end sealant 600 is also provided. In the illustratedembodiment, the exterior pane 10 has an exterior surface 12 (the #1surface) and an interior surface 14 the #2 surface). The interior pane10′ has an interior surface 16 (the #3 surface) and an exterior surface18 (the #4 surface). The unit can optionally be mounted in a frame(e.g., a window frame) such that the exterior surface 12 of the exteriorpane 10 is exposed to an outdoor environment 77 while the exteriorsurface 18 of the interior pane 10′ is exposed to a room-side interiorenvironment. Interior surfaces 14 and 16 are both exposed to theatmosphere in the between-pane space 800 of the insulating glazing unit.

In the embodiment of FIG. 7, the exterior surface 12 of pane 10 has thelow-maintenance coating 80. In the embodiment of FIG. 8, the exteriorsurface 18 of pane 10′ has the low-maintenance coating 80. In otherembodiments, both exterior major surfaces of an IG unit havelow-maintenance coatings. The coating(s) 80 can be in accordance withany embodiment described in this disclosure. If desired, the coating 80can be one of those described in Tables 1-5B. In other words, any ofCoatings #1-5B in Tables 1-5B (or any other embodiment of thelow-maintenance coating disclosed herein) can be provided on exteriorsurface 12, exterior surface 18, or both. The interior surface 14 ofpane 10 can optionally have a functional coating 70 selected from thegroup consisting of a low-emissivity coating and a transparentconductive oxide coating. The IG unit can have two, three, or morepanes. For example, one group of embodiments provides a triple-paneinsulating glazing unit having at least one exterior surface bearing thelow-maintenance coating.

FIG. 9 exemplifies embodiments where the substrate 10 is a window panemounted on a window frame 95 (e.g., in an exterior wall 98 of a building99). In certain applications, the first surface of the window carriesthe low-maintenance coating 80. In some embodiments of this nature,coated surface 12 is exposed to an outdoor environment 77 (e.g., so asto be in periodic contact with rain).

The invention also provides methods for producing low-maintenanceproducts. In these methods, each film of the coating 80 can generally bedeposited by a variety of well known coating techniques. Suitablecoating techniques include, but are not limited to, chemical vapordeposition (CVD), plasma enhanced chemical vapor deposition, pyrolyticdeposition, sol-gel deposition and sputtering. In preferred embodiments,the films are deposited by sputtering.

Some embodiments involve depositing the low-maintenance coating so as tohave an average surface roughness Ra, as deposited, of between 0.35 nmand 3.0 nm, such as between 0.35 nm and 3.0 nm, and in some casesbetween 0.35 nm and 1.5 nm. Different applications, however, may requiredifferent levels of photoactivity, different levels of surfaceroughness, etc., so the noted roughness ranges are not required in allembodiments.

FIGS. 10-12 each schematically depict a coat zone 200 that can be usedto deposit one or more films of the low-maintenance coating 80. FIGS.10-12 depict six targets above and/or below the path of substrate travelin each coat zone. One or more of the adjacent target pairs, however,can be replaced with a single target, if so desired. In practice, eachadjacent pair of targets may be in its own chamber (or “bay”), and thechambers may be grouped into separate coat zones. Since many differenttypes of coaters can be used, these details are by no means limiting.

Sputtering chambers and related equipment are commercially availablefrom a variety of sources (such as Applied Materials or Leybold). Usefulmagnetron sputtering techniques and equipment are described in U.S. Pat.No. 4,166,018, issued to Chapin, the salient teachings of which areincorporated herein by reference. In FIGS. 10-12, each coat zone 200 isshown as being a single chamber that includes a base (or “floor”) 220, aplurality of side walls 222, and a ceiling (or “top lid” or “cover”)230, together bounding a sputtering cavity 202. However, each coat zonemay actually comprise a series of chambers. The chambers can beconnected by a series of tunnels or inter-stage sections. The substrate10 is conveyed along the path of substrate travel 45 during filmdeposition, optionally over a plurality of spaced-apart transportrollers 210.

In FIG. 10, upper targets 270 a-270 f are mounted above the path ofsubstrate travel 45. Thus, the coat zone of FIG. 10 operates as adownward sputtering chamber. In FIG. 11, lower targets 280 a-280 f aremounted beneath the path of substrate travel 45. Thus, the coat zone ofFIG. 11 operates as an upward sputtering chamber. In FIG. 12, both uppertargets 270 a-270 f and lower targets 280 a-280 f are provided. One ormore films of the low-maintenance coating 80 can therefore be sputterdeposited onto one side of the substrate, while one or more films ofanother functional coating 70 are simultaneously sputtered onto theother side of the substrate. Thus, the coat zone of FIG. 12 can operateas a dual-direction sputtering chamber. Dual-direction sputteringchambers are described in U.S. Pat. No. 6,964,731, the teachings ofwhich concerning dual-direction sputtering chambers are incorporatedherein by reference. FIGS. 10 and 11 each show six total targets, andFIG. 12 shows 12 total targets, but this is by no means required.Rather, any suitable number of targets can be provided. Moreover, FIGS.10-12 show cylindrical targets, but planar targets can also be used (incombination with, or in place of, cylindrical targets).

In certain embodiments, the substrate 10 is subjected to one or moreheat treatments. The substrate, for example, can optionally be heattreated before and/or after the low-maintenance coating has beendeposited. The substrate can also be heat treated during deposition ofthe low-maintenance coating. For example, the substrate can optionallybe heated in one or more chambers in which at least some of the filmcomprising titania is deposited. In some embodiments, thelow-maintenance coating 80 includes a base film 15 and the substrate isheat treated before, after, or during deposition of the base film 15. Itis to be appreciated, though, that the coating is not required toundergo any heating before, during, or after deposition.

In some embodiments, heat treatment occurs in a heating chamber that ispart of a coater. Reference is made to FIGS. 13 and 14, which illustratetwo exemplary heating chambers 300. Here, the heating chamber 300includes a base (or “floor”) 320, a plurality of side walls 322, and aceiling (or “top lid” or “cover”) 330, together bounding a heatingcavity 202. When provided, the heating device 370, 380 is adjacent tothe path of substrate travel. In FIG. 13, the heating device 370 ismounted above the path of substrate travel. The heating chamber of FIG.13 may be particularly useful for heating a substrate on which alow-maintenance coating is deposited by downward sputtering, such as ina downward sputtering chamber (as illustrated by FIG. 10) or adual-direction sputtering chamber (as illustrated by FIG. 12). In FIG.14, the heating device 380 is mounted beneath the path of substratetravel. The heating chamber of FIG. 14 may be particularly useful forheating a substrate on which a low-maintenance coating is deposited byupward sputtering, such as in an upward sputtering chamber (asillustrated by FIG. 11) or a dual-direction sputtering chamber (asillustrated by FIG. 12). The heating device 370, 380 can also be used inconjunction with deposition methods other than sputtering.

The heating device 370, 380 can include any apparatus known in the artfor heating glass substrates or the like. The device 370, 380, forexample, can be a resistance heater. In certain embodiments, the heatingdevice includes ceramic heaters, such as radiant quartz heaters. Onesuitable heater is a High Intensity Quartz Faced Radiant Heater soldcommercially by Chromalox, Inc., a corporation having its headquartersin Pittsburgh, Pa., USA. In other embodiments, flash lamps are used forheating. Ceramic infrared heaters are available from a variety ofcommercial suppliers, such as National Plastic Heater Sensor & ControlInc. (Scarborough, Ontario, Canada).

While FIGS. 13 and 14 illustrate heating chambers that perform the heattreating, heat treatments can alternatively (or additionally) beperformed at other locations inside a coater. For example, the heattreatments can be performed inside a deposition chamber, such as insidea sputtering chamber. Thus, a heating device can be provided inside adeposition chamber. For example, the heating device can be mounted belowthe path of substrate travel 45 in a downward deposition chamber (suchas a downward sputtering chamber). As another alternative, the heatingdevice can be mounted above the path 45 in an upward deposition chamber(such as an upward sputtering chamber). The heating device can bemounted at a position inside a deposition chamber upstream from wheredeposition takes place, downstream from where deposition takes place, orat a location where deposition takes place.

Heating can also be made to occur inside a deposition chamber byadjusting the deposition parameters to increase the temperature of thesubstrate. Methods of adjusting the deposition parameters are known toskilled artisans and need not be discussed in detail. In some cases, thedeposition chamber is a sputtering chamber and helium or hydrogen isadded to the sputtering atmosphere. In other cases, AC sputtering can beused, rather than DC sputtering, so as to increase the temperature ofthe substrate. Thus, the substrate can optionally be heated in at leastone deposition chamber in which the functional film 50 is deposited, andthe heating may be caused at least in part by the sputtering processitself.

In some embodiments, heat treatment takes place at an inter-stagesection 400 of a coater (i.e., in a non-deposition section betweenneighboring deposition chambers). In some cases, the inter-stage section400 comprises a tunnel. FIG. 15 schematically illustrates an inter-stagesection 400 connecting a heating chamber 300 and a sputtering chamber200. Skilled artisans will understand that the inter-stage section 400can instead connect two sputtering chambers or other sections of acoater. Preferably, transport rollers extend from one chamber, throughthe inter-stage section 400, and into the next chamber. The substratethus travels from one chamber to the next by passing through section400. Typically, as substrates are transported from one chamber to thenext, heat from the substrate is lost. Thus, in certain embodiments, theinter-stage section 400 is adapted to allow the substrate to retainheat, such that as the substrate is transported through it, heat loss isminimized. In some cases, a heating device is provided in theinter-stage section 400. In other cases, the inter-stage section 400 isheated by an external heating source, e.g., a radiant heater.

If desired, the inter-stage section 400 can be fabricated of materialthat holds heat. FIG. 15 illustrates one embodiment of an inter-stagesection 400 that is constructed so that it maintains heat. Referring toFIG. 16, section 400 can optionally have a base (or “floor”) 420, sidewalls 422, and a ceiling 430, together bounding an interior space 402that houses transport rollers 210 that transport a substrate 10. Thebase 420, side walls 422, and ceiling 430 form a rectangular tunnel, butother shapes, for example square and circular tunnels, are within thescope of the invention. Preferably, the base 420, side walls 422, andceiling 430 are formed as a single piece, for example like a matchboxslip. In FIG. 16, the section 400 has a layered configuration, includinglayers of a conductive material 450 surrounded by layers of a ceramicmaterial 470. In the illustrated embodiment, three layers of conductivematerial 450 and three layers of ceramic material 470 are shown, but anysuitable number of layers can be provided. The layer of conductivematerial 450 can include any conductive metal, such as aluminum orcopper. The layer of ceramic material 470 can include any dielectricthat prevents heat from escaping outwards. Such ceramic may includesilicon nitride, magnesium oxide, calcium oxide, zirconia, alumina,chromite, silicon carbide, carbon, and mullite. A heating source 500 canbe provided, for example a radiant heater that applies heat to one ormore of the conductive layers 450. Such a layered configuration may helpto maintain the heat inside the interior space 402. In some embodiments,the interior space is maintained at a temperature of at least 160° F.

Some particularly advantageous methods involve depositing alow-emissivity coating on one major surface of a substrate anddepositing a low-maintenance coating on an opposite major surface. Insputter-up/sputter-down embodiments of this nature, the low-emissivitycoating can optionally be deposited before beginning the sputterdeposition of the low-maintenance coating. This can be advantageous,since the heat associated with depositing the low-emissivity coating canprovide the substrate with an elevated temperature upon beginning thesputter deposition of the low-maintenance coating. In connection withthe coated glass reported in the examples below (which are alsotabulated above), the low-maintenance coating was deposited by an upwardsputtering process that was begun after a double-silver low-emissivitycoating was deposited on the other side of the glass by a downwardsputtering process. It is surmised that the heat associated withdepositing the low-emissivity coating provides the glass with anelevated temperature when beginning to sputter deposit thelow-maintenance coating, and the reported photoactivity levels arebelieved to be achieved at least in part due to this substrate heating.

Thus, certain embodiments provide a production method wherein alow-emissivity coating is sputter deposited onto one major surface of asubstrate, and thereafter at least part of (optionally an entirety of) alow-maintenance coating is deposited onto the other major surface of thesubstrate. As noted above, the sputter deposition of the low-emissivitycoating can heat the substrate, whereafter the deposition of thelow-maintenance coating can be initiated while the substrate is stillhot (i.e., before it has cooled to room temperature). This may improvethe photoactivity, hydrophilicity, morphology, or other characteristicsof the low-maintenance coating.

FIGS. 17 and 18 schematically illustrate two exemplary coaters that canbe used to produce the low-maintenance coating in accordance withcertain embodiments. FIG. 17 illustrates a coater having downwardcoating chambers 200 a, 200 b, 200 c, and 200 d (shown here with uppersputtering targets 270 a -270 x) and a downward heating chamber 300(with upper heating device 370). FIG. 18 illustrates a coater havingupward coating chambers 200 a, 200 b, 200 c, and 200 d (shown here withlower sputtering targets 280 a -280 x) and an upward heating chamber(with lower heating device 380). A substrate is conveyed along the pathof substrate travel 45 through the coater in the following order:coating chamber 200 a, inter-stage section 400 a, coating chamber 200 b,inter-stage section 400 b, coating chamber 200 c, inter-stage section400 c, heating chamber 300, inter-stage section 400 d, and coatingchamber 200 d. In certain embodiments, coating chambers 200 a and 200 bare used to deposit a base film 15 and/or any intermediate films 20, andcoating chambers 200 c and 200 d are used to deposit the functional film50. If desired, additional chambers can be provided, e.g., inembodiments where more films are provided.

In certain embodiments, a base film 15 is deposited in coating chambers200 a and 200 b. In these embodiments, coating chambers 200 a and 200 bcan optionally be provided with targets carrying the same sputterablematerial (270 a-270 l, 280 a -280 l). In other embodiments, the basefilm 15 is deposited in coating chamber 200 a and an intermediate film20 is deposited in coating chamber 200 b. In these embodiments, coatingchamber 200 a is provided with the same sputterable material (270 a-270f, 280 a-280 f) for depositing a base film 15 and coating chamber 200 bis provided with another sputterable material (270 g-270 l, 280 g-280 l)for depositing an intermediate film 20.

The sputterable material can optionally be a metal, semi-metal, compoundof different metals, or a compound of at least one metal and at leastone semi-metal. In such cases, an oxidizing atmosphere (optionallyincluding some argon and/or nitrogen) may be used for sputtering. Thetargets can alternatively be ceramic (e.g., oxide), and an inert (orslightly oxidizing and/or slightly nitriding) atmosphere may be used. Inembodiments where the base film 15 comprises silica, targets comprisingsilicon may be used. The targets comprising silicon may, for example, besilicon-aluminum targets. In embodiments where the base film 15comprises alumina, targets comprising aluminum can be used. When thebase film 15 is provided, it can alternatively comprise titaniumdioxide, silicon nitride, tin oxide, zirconium oxide, anotherdielectric, or a semiconductor.

In embodiments where the base film 15 is a mixed oxide film, aco-sputtering method can optionally be used. For example, one target ina chamber can comprise one material while another target in the samechamber comprises another material. For example, if coating chamber 200a is used to deposit a base film 15, targets 270 a, 270 c, and 270 e (ortargets 280 a, 280 c, 280 e) can comprise material A and targets 270 b,270 d, and 270 f (or targets 280 b, 280 d, and 280 f) can comprisematerial B. Likewise, if both coating chambers 200 a and 200 b are usedto deposit a base film 15, targets 270 a, 270 c, 270 e, 270 g, 270 i,and 270 k (or targets 280 a, 280 c, 280 e, 280 g, 280 i, and 280 k) cancomprise material A and targets 270 b, 270 d, 270 f, 270 h, 270 j, and270 l (or targets 280 b, 280 d, 280 f, 280 h, 280 j, and 280 l) cancomprise material B.

If desired, the targets can be metal targets and an oxidizing atmosphere(optionally including argon and/or nitrogen) can be used. The targetscan alternatively be ceramic, and an inert (or slightly oxidizing and/orslightly nitriding) atmosphere can be used. For example, in embodimentswhere the base film 15 is a mixed oxide film comprising silica andtitania, material A can comprise silicon and material B can comprisetitanium. Any intermediate film(s) 20 having a mixed oxide film can bedeposited in the same manner.

With continued reference to FIGS. 17 and 18, once the base film 15and/or any intermediate films 20 are deposited, in some embodiments thesubstrate then travels through chamber 200 c, where deposition of thefunctional film 50 begins. In embodiments where this film 50 issubstantially homogenous, targets 270 m-270 r, 280 m-280 r can all carrythe same sputterable material. These targets, for example, can be metaland an oxidizing atmosphere can be used. The targets can alternativelybe ceramic, and an inert (or slightly oxidizing) atmosphere can be used.

In the exemplary embodiments of FIGS. 17 and 18, once a first part ofthe functional film 50 is deposited in chamber 200 c, the substrate 10travels through a heating chamber 300, where a heater 370, 380 suppliesheat to the substrate. Again, it is to be appreciated that the heatercan be omitted, if so desired. The substrate then travels through coater200 d, where the rest of the film 50 is deposited.

As noted above, if the substrate is annealed glass (and is to retain theanneal), it is preferred not to heat the glass to temperatures that willadversely affect the annealed state of the glass. For example, maximumglass temperatures below 350° F. are preferred, and temperatures below300° F. (or even below 250° F.) may be more preferred. In someembodiments, the substrate is heated (e.g., during deposition) to amaximum temperature of between 140° F. and 350° F., such as betweenabout 170° F. and about 210° F. It is to be appreciated that thesubstrate is not required to be heated prior to or during deposition.Instead, the coated substrate may be heat treated after deposition. Or,the coated substrate may simply be produced without heat treatment.

One group of embodiments provides a sputtering target having asputterable material comprising both titanium and tungsten. For example,the sputterable material can optionally include titanium in the form ofmetal titanium, titanium monoxide, titanium dioxide and/or titaniumtrioxide, while the tungsten is in the form of metal tungsten, tungstenoxide, tungsten dioxide, and/or tungsten trioxide. In some cases, thesputterable material comprises both titanium and tungsten in a varietyof the above forms.

In certain embodiments, the sputterable material consists essentially oftitanium metal and tungsten metal. An alloy target comprising bothtitanium and tungsten could be used. Or, one could use a metal titaniumtarget provided with strips (or the like) of metal tungsten. When metaltargets are sputtered, an oxidizing atmosphere (optionally with a slightamount of nitrogen) can be used.

In other embodiments, the sputterable material comprises both titaniumoxide and tungsten oxide. In these cases, an inert atmosphere or aslightly oxidizing atmosphere (optionally including a small amount ofnitrogen) can be used during sputtering. In certain embodiments, thesputterable material comprises titanium monoxide, titanium dioxide, andtungsten oxide. In these cases, a slightly oxidizing atmosphere(optionally including a small amount of nitrogen) can be used duringsputtering. Or, the targets could be sputtered in an inert atmosphere,e.g., if the resulting film is not required to be fully oxidized (or ifit will be further oxidized, such as during a subsequent heat treatmentin air). In certain cases, the sputterable material is characterized bya metal-only W/Ti weight ratio of between about 0.01 and 0.34, such asbetween about 0.01 and about 0.2, this ratio being the total weight ofthe tungsten atoms in the sputterable material divided by the totalweight of the titanium atoms in the sputterable material.

A target with sputterable material comprising both titanium and tungstencan be prepared using a number of different methods. In someembodiments, a target is prepared by plasma spraying titanium oxidetogether with tungsten metal onto a target base in an atmosphere that isoxygen deficient and does not contain oxygen-containing compounds.During the plasma spraying process, the action of the plasma on thetitanium oxide causes the titanium oxide to lose some oxygen atoms fromtheir lattices. These oxygen atoms are believed to combine with themetal tungsten to form tungsten oxide, as tungsten has a highelectrochemical potential. The titanium oxide sprayed onto the backingtube may thus comprise titanium monoxide, titanium dioxide, and tungstenoxide. The sputterable target may, as just one example, be a cylindricalrotary target having a backing tube with a length of at least 24 inches.In such cases, the sputterable material is carried on an exterior wallof the backing tube. Such a cylindrical target is also adapted to rotateabout a central axis to which the exterior wall of the backing tube issubstantially parallel. Alternatively, hot isostatic pressing may beused to form a target. Other target forming methods can also be used.

When the functional film 50 is deposited by sputtering one or moretargets comprising both tungsten oxide and substoichiometric TiOx, thesputtering is preferably carried out using argon, a mixture of argon andoxygen, a mixture of nitrogen and argon, a mixture of nitrogen andoxygen, or a mixture of oxygen, nitrogen, and argon. If the plasma gasdoes not contain oxygen, e.g., if pure argon is used, then the coatingwill not be fully oxidized when deposited. In contrast, if the plasmagas contains oxygen, then the reduced form(s) of titanium oxide may beconverted during the sputtering process into the transparent form, whichis stoichiometric or substantially stoichiometric. The film's degree oftransparency will depend upon the amount of oxygen contained in theplasma gas and/or whether any subsequent heat treatment is performed inair. An exemplary gas mixture to form transparent film is 70-90% byvolume argon and 30-10% by volume of oxygen. In some cases, the gasmixture can include as little as 1-3% by volume oxygen, with theremainder being argon.

In embodiments where the film 50 comprises both titanium oxide andtungsten oxide, a co-sputtering method can optionally be used. Forexample, one target can comprise titanium metal while an adjacent targetcomprises tungsten metal. As another option, each target can carry asputterable metallic material that is a compound (e.g., an alloy)comprising both titanium metal and tungsten metal.

As noted above, the substrate in some embodiments is glass. It is oftendesirable or necessary to use tempered glass for certain applications,as is well known. In such cases, after the substrate has been coatedwith the low-maintenance coating 80, the coated substrate can betempered. In certain embodiments, the coated substrate is positioned ina tempering furnace for at least 60 seconds, during which time thefurnace is set at a temperature of at least 650° C. In some cases, thisbrings the coated substrate to a temperature of at least about 640° C.Then, the substrate is rapidly cooled down. Preferably, once thesubstrate reaches room temperature, it exhibits a haze of less than 0.4(more preferably less than 0.2, or even less than 0.15) after heattreatment. Skilled artisans will be familiar with a variety of temperingmethods that can be used to produce commercially acceptable temperedglass.

Some exemplary film stacks and deposition methods will now be described.

EXAMPLE #1

A soda-lime glass substrate was transported through a coat zone havingtwo operating pairs of rotary silicon targets (each including about 15%aluminum). A gas mix comprising about 40-60% argon and the remainderoxygen was provided in each chamber, and the targets were sputtered todeposit a high-rate base film comprising silica on surface 12 of thesubstrate. The power on each pair of rotary targets was 60 Kw. The glasswas conveyed at about 275 inches per minute. The base film had athickness of about 200 Å.

Next, the substrate was transported through another coat zone, this onehaving three operating pairs of rotary ceramic targets (each withsputterable material consisting essentially of titanium oxide andtungsten oxide, where the titanium is present at about 59-74 weight %,the tungsten is present at about 1.4-3.8 weight %, and the oxygen ispresent at about 23.3-38.6 weight %). A gas mix of about 85% argon (andthe remainder oxygen) was used, and the ceramic targets were sputteredto deposit the functional film. The power on each pair of rotary targetswas 80 Kw. The functional film had a thickness of about 70 Å. The glasswas conveyed at a speed of about 267 inches per minute.

The substrate was annealed glass. No post-deposition tempering or otherheat treatment was performed. However, the low-maintenance coating wasapplied by upward sputtering after a double-silver low-emissivitycoating was applied by downward sputtering (the low-emissivity coatingwas downwardly sputtered in a first part of the coater, and thelow-maintenance coating was upwardly sputtered in a second part of thesame coater). Thus, it is surmised that the glass retained heat from thedeposition of the low-emissivity coating when the sputtering began forthe low-maintenance coating.

The low-maintenance coating had an average surface roughness Ra of about0.39 nm. The coating exhibited an acetone decomposition rate of about2.14×10⁻¹⁰ moles/(liter)(second).

EXAMPLE #2

A low-maintenance coating was deposited on a glass substrate in themanner described above in Example #1. Once the coating was deposited,the glass was heat-treated in a furnace in a manner that simulatestempering in a commercial production setting. The furnace used is aHengLi RSK-2506 Fast Response Conveyor Furnace manufactured by HengLiEletek Co., Ltd. (Hefei.Ah. China). The furnace is approximately 5.3meters long with 6 zones for heating and cooling. The coated glass wasconveyed in a single pass through the furnace at about 300 mm/second,taking about 19.4 minutes. The heat zone of the lab furnace was set at690° F. The coated glass takes about 7.2 minutes to go through theapproximately 2.2 meter long heat zone. The coated glass then exits theheat zone, and enters and passes through the approximately 1.8 metercooling zone for about 6 minutes before exiting the furnace. It isestimated that the glass (which in this example was 3.1 mm soda-limeglass) reached a temperature of about 640° F.

The low-maintenance coating had an average surface roughness Ra of about2.75 nm. The coating exhibited an acetone decomposition rate of about6.82×10⁻¹⁰ moles/(liter)(second).

EXAMPLE #3

A soda-lime glass substrate was coated with a base film comprisingsilica at a thickness of about 200 Å in the manner described above inExample #1.

Next, the substrate was transported through another coat zone, this onehaving three operating pairs of rotary ceramic targets (with the samesputterable material described above in Example #1). A gas mix of about85% argon (and the remainder oxygen) was used, and the ceramic targetswere sputtered to deposit the functional film. The power on each pair ofrotary targets was 80 Kw. The functional film had a thickness of about55 Å. The glass was conveyed at a speed of about 340 inches per minute.

The substrate was annealed glass. However, this coating was applied byupward sputtering after a double-silver low-emissivity coating wasapplied by downward sputtering. Therefore, it is believed that the glassretained heat from the deposition of the low-emissivity coating when thesputtering began for the low-maintenance coating. No post-depositiontempering or other heat treatment was performed.

The low-maintenance coating had an average surface roughness Ra of about0.44 nm. The coating exhibited an acetone decomposition rate of about1.97×10⁻¹⁰ moles/(liter)(second).

EXAMPLE #4

A low-maintenance coating was deposited on a glass substrate in themanner described above in Example #3. The glass was then heat treated inthe manner described above in Example #2.

The low-maintenance coating had an average surface roughness Ra of about2.34 nm. The coating exhibited an acetone decomposition rate of about5.46×10⁻¹⁰ moles/(liter)(second).

COMPARATIVE EXAMPLE

A coating having an outer film of titanium dioxide was prepared, and isillustrated in Table 6 (“Comparative Coating #6”).

TABLE 6 (Comparative Coating #6) Component Material Thickness Outer FilmTitanium Oxide 25-40 Å Base Film Silica 75 Å Substrate Glass —Comparative Coating #6 exhibited an acetone decomposition rate of about1.25×10⁻¹⁰ moles/(liter)(second).

While certain preferred embodiments of the invention have beendescribed, it should be understood that various changes, adaptations andmodifications can be made without departing from the spirit of theinvention and the scope of the appended claims.

1. A substrate having a major surface on which there is alow-maintenance coating, the low-maintenance coating including afunctional film comprising both titanium oxide and tungsten oxide,wherein the substrate is glass in an annealed state, and wherein thefunctional film has a thickness of less than 150 Å and yet thelow-maintenance coating has an acetone decomposition rate of greaterthan 1.4×10⁻¹⁰ moles/(liter)(second).
 2. The substrate of claim 1wherein the thickness of the functional film is less than 100 Å and yetthe acetone decomposition rate is greater than 1.91×10⁻¹⁰moles/(liter)(second).
 3. The substrate of claim 1 wherein thefunctional film has a thickness of greater than 40 Å, and thelow-maintenance coating, if tempered, experiences an increase of itsacetone decomposition rate by more than a factor of 1.5 due to thetempering.
 4. The substrate of claim 1 wherein the low-maintenancecoating, if tempered, experiences an increase of its acetonedecomposition rate, the increase resulting in the acetone decompositionrate being greater than 1.8×10⁻¹⁰ moles/(liter)(second).
 5. Thesubstrate of claim 1 wherein the low-maintenance coating, if tempered,experiences an increase of its acetone decomposition rate, the increaseresulting in the acetone decomposition rate being greater than 4×10⁻¹⁰moles/(liter)(second).
 6. The substrate of claim 1 wherein thefunctional film has a thickness of about 50-80 Å.
 7. The substrate ofclaim 1 wherein the functional film has a tungsten load characterized bya metal-only weight ratio of between about 0.01 and about 0.34, thisratio being the weight of the tungsten in the film divided by the weightof the titanium in the film.
 8. The substrate of claim 1 wherein thelow-maintenance coating has an average surface roughness of between 0.35nm and 3.0 nm.
 9. The substrate of claim 1 wherein the low-maintenancecoating includes a base film between the substrate and the functionalfilm, and wherein the base film and the functional film have a combinedthickness of less than about 350 Å.
 10. The substrate of claim 1 whereinthe functional film is a substantially homogenous film defining anexposed, outermost face of the low-maintenance coating.
 11. Thesubstrate of claim 1 wherein the substrate is a transparent pane that ispart of a multiple-pane insulating glazing unit having a between-panespace, wherein the major surface bearing the low-maintenance coatingfaces away from the between-pane space of the unit.
 12. The substrate ofclaim 1 wherein the substrate is part of a triple-pane insulatingglazing unit.
 13. The substrate of claim 1 wherein the substrate is partof a multiple-pane insulating glazing unit having two exterior majorsurfaces each bearing a low-maintenance coating comprising both titaniumoxide and tungsten oxide.
 14. A substrate having a major surface onwhich there is a low-maintenance coating, the low-maintenance coatingincluding a functional film comprising both titanium oxide and tungstenoxide, wherein the substrate is glass in a tempered state, and whereinthe functional film has a thickness of less than 150 Å and yet thelow-maintenance coating has an acetone decomposition rate of greaterthan 1.8×10⁻¹⁰ moles/(liter)(second).
 15. The substrate of claim 14wherein the thickness of the functional film is less than 100 Å and yetthe acetone decomposition rate of the low-maintenance coating is greaterthan 4.0×10⁻¹⁰ moles/(liter)(second).
 16. The substrate of claim 14wherein the functional film has a thickness of about 50-80 Å.
 17. Thesubstrate of claim 14 wherein the low-maintenance coating includes abase film between the substrate and the functional film, and wherein thebase film and the functional film have a combined thickness of less thanabout 350 Å.
 18. The substrate of claim 14 wherein the functional filmhas a tungsten load characterized by a metal-only weight ratio ofbetween about 0.01 and about 0.34, this ratio being the weight of thetungsten in the film divided by the weight of the titanium in the film19. A substrate having a major surface on which there is alow-maintenance coating that includes a base film and a functional film,the functional film comprising both titanium oxide and tungsten oxide,the base film being a high-rate sputtered film deposited using at leastone target in an atmosphere into which both inert gas and reactive gasare flowed, wherein an inflow rate for the inert gas divided by aninflow rate for the reactive gas is between 0.4 and 9, the functionalfilm being a high-rate sputtered film deposited from at least one targethaving a sputterable material comprising both titanium oxide andtungsten oxide.
 20. The substrate of claim 19 wherein an average surfaceroughness of the low-maintenance coating is between 0.35 nm and 5.0 nm.21. The substrate of claim 19 wherein the sputterable target materialused in depositing the functional film includes: i) tungsten in oxideform, ii) TiO, and iii) TiO₂.
 22. The substrate of claim 19 wherein thesubstrate is glass in an annealed state, and wherein the functional filmhas a thickness of less than 150 Å and yet the low-maintenance coatinghas an acetone decomposition rate of greater than 1.4×10⁻¹⁰moles/(liter)(second).
 23. The substrate of claim 22 wherein thethickness of the functional film is less than 100 Å and yet the acetonedecomposition rate is greater than 2.0×10⁻¹⁰ moles/(liter)(second). 24.A method of depositing of a low-maintenance coating on a major surfaceof a substrate, the low-maintenance coating including a base film and afunctional film, the base film being deposited by a high-rate sputteringtechnique wherein at least one target is sputtered in an atmosphere intowhich both inert gas and reactive gas are flowed, wherein an inflow ratefor the inert gas divided by an inflow rate for the reactive gas isbetween 0.4 and 9, the functional film being deposited by a high-ratesputtering technique that uses at least one target having a sputterablematerial comprising both titanium oxide and tungsten oxide.
 25. Themethod of claim 24 wherein the high-rate sputtering technique fordepositing the base film involves a plurality of targets each carrying asputterable material consisting essentially of: 1) one or more metals,or 2) one or more semi-metals, or 3) at least one metal and at least onesemi-metal, and the high-rate sputtering technique for depositing thefunctional film involves a plurality of oxide targets each carrying thesputterable material comprising both titanium oxide and tungsten oxide.26. The substrate of claim 25 wherein the sputterable material used indepositing the base film includes silicon, and wherein the sputterablematerial used in depositing the functional film includes: i) tungsten inoxide form, ii) TiO, and iii) TiO₂.
 27. The method of claim 24 whereinthe inert gas is argon and the reactive gas is oxygen or nitrogen.
 28. Asputtering technique for depositing a low-maintenance coating over amajor surface of a substrate, wherein the sputtering technique includessputter depositing a base film over said major surface and sputterdepositing a functional film over the base film, the functional filmcomprising both titanium oxide and tungsten oxide, the sputterdeposition being performed such that the low-maintenance coating, asdeposited, has an average surface roughness of between about 0.35 nm and3.0 nm, wherein the substrate is glass in an annealed state, and whereinthe functional film has a thickness of less than 150 Å and yet thelow-maintenance coating has an acetone decomposition rate of greaterthan 1.4×10⁻¹⁰ moles/(liter)(second).
 29. The sputtering technique ofclaim 28 wherein at least part of the thickness of the functional filmis deposited by sputtering one or more targets each having a sputterablematerial comprising both titanium oxide and tungsten oxide, thesputterable material including: i) tungsten in oxide form, ii) TiO, andiii) TiO₂.
 30. The sputtering technique of claim 29 wherein thesputterable material consists essentially of: i) tungsten in oxide form,ii) TiO, and iii) TiO₂.
 31. The sputtering technique of claim 29 whereinsubstantially all the tungsten in the sputterable material is in oxideform.
 32. The sputtering technique of claim 29 wherein the sputterablematerial is characterized by a metal-only weight ratio of between about0.01 and about 0.34, this ratio being the weight of the tungsten in thesputterable material divided by the weight of the titanium in thesputterable material.
 33. The sputtering technique of claim 28 whereinthe sputter deposition of the base film is performed in an atmosphereinto which both inert gas and reactive gas are flowed, and wherein aninflow rate for the inert gas divided by an inflow rate for the reactivegas is between 0.4 and
 9. 34. The sputtering technique of claim 33wherein the inert gas is argon and the reactive gas is oxygen ornitrogen.
 35. The sputtering technique of claim 28 wherein the sputterdeposition is performed such that the average surface roughness of thelow-maintenance coating, as deposited, is between about 0.35 nm and 1.5nm.
 36. A substrate having a major surface on which there is alow-maintenance coating, the low-maintenance coating having only asingle photocatalytic layer, the photocatalytic layer comprising bothtitanium oxide and tungsten oxide throughout an entire thickness of thelayer, wherein the substrate is glass in an annealed state, and whereinthe photocatalytic layer has a thickness of less than 150 Å and yet thelow-maintenance coating has an acetone decomposition rate of greaterthan 1.4×10⁻¹⁰ moles/(liter)(second).
 37. The substrate of claim 36wherein the thickness of the photocatalytic layer is less than 100 Å andyet the acetone decomposition rate is greater than 2.1×10⁻¹⁰moles/(liter)(second).
 38. A substrate having a major surface on whichthere is a low-maintenance coating, the low-maintenance coating havingonly a single photocatalytic layer, the photocatalytic layer comprisingboth titanium oxide and tungsten oxide throughout an entire thickness ofthe layer, wherein the substrate is glass in a tempered state, andwherein the photocatalytic layer has a thickness of less than 150 Å andyet the low-maintenance coating has an acetone decomposition rate ofgreater than 1.8×10⁻¹⁰ moles/(liter)(second).
 39. The substrate of claim38 wherein the thickness of the photocatalytic layer is less than 100 Åand yet the acetone decomposition rate is greater than 6.75×10⁻¹⁰moles/(liter)(second).